INSTRUMENT INFORMATION
Brand: JEOL
Model: JSM-7600F
Brief Description:
Field Emission Scanning Electron Microscope (FESEM) consist of:
- Secondary Electron Image Observation (SEI) – Secondary electrons are used to observe the topography of the specimen surface.
- Low Angle Backscattered Electron Image Observation (LABE) - Backscattered electrons are mainly used to observe the compositional differences of the specimen.
- EDS (Elemental) Analysis - This is a function to obtain a spectrum of the energy intensity of X-rays by using EDX- Oxford Instrument. All elements from B to U can be detected and measured simultaneously.
- Gentle Beam (GB) provides top-surface imaging with ultra-low energy incident electrons
Specifications:
Magnification : 25 to 1,000,000
Acce.voltage : 0.1kV to 30kV
Probe current : 1pA to 200Na
Sample Criteria:
Dry, non-magnetic, powder, thin film, solid
Location:
Room A124 ,Ground Floor, Block A Physics Department
Person In-charge:
Science Officer: Pn. Nor Endang Ariffin (Phone no.: +603-79675174 / +6019-7552012)
Instrument Status:
