• Department of Physics
  • ketua_fizik@um.edu.my
  • 03-7967 4206


Brand: JEOL

Model: JSM-7600F

Brief Description:

Field Emission Scanning Electron Microscope (FESEM) consist of:

  • Secondary Electron Image Observation (SEI) – Secondary electrons are used to observe the topography of the specimen surface.
  • Low Angle Backscattered Electron Image Observation (LABE) - Backscattered electrons are mainly used to observe the compositional differences of the specimen.
  • EDS (Elemental) Analysis - This is a function to obtain a spectrum of the energy intensity of X-rays by using EDX- Oxford Instrument. All elements from B to U can be detected and measured simultaneously.
  • Gentle Beam (GB) provides top-surface imaging with ultra-low energy incident electrons


Magnification : 25 to 1,000,000
Acce.voltage : 0.1kV to 30kV
Probe current : 1pA to 200Na

Sample Criteria:

Dry, non-magnetic, powder, thin film, solid


Room A124 ,Ground Floor, Block A Physics Department

Person In-charge:

Supervisor: Mrs. Nor Endang Binti Ariffin (Phone no.: +603-79675174 / +6019-7552012)

Assistant Science Officer: MrsNisrin Binti Norannis

Assistant Science Officer: Ms.Nor Hazlizaaini Binti Basri

Instrument Status:

Last Update: 05/10/2022