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HR-XRD Laboratory

HR-XRD

Features

  • This SmartLab was commisioned on 2019 and is located at Bangunan Low Dimensional Research Centre (J20)
  • Dedicated for thin film analysis
  • Profile Measurement Technique: Bragg-Brentano (BB), Parallel Beam (PB), In-plane XRD
  • Thickness Evaluation: XRR, HR Rocking Curve
  • Crystal Quality Analysis: Rocking Curve, Reciprocal Space Map